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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Breitkreutz, S. Kiermaier, J. Yilmaz, C. Xueming Ju Csaba, G. Schmitt-Landsiedel, D. Becherer, M. |
| Copyright Year | 2011 |
| Description | Author affiliation: Lehrstuhl für Nanoelektronik, Technische Universität München, 80333 Munich, Germany (Xueming Ju) || Center for Nano Science and Technology, University of Notre Dame, IN 46556, USA (Csaba, G.) || Lehrstuhl für Technische Elektronik, Technische Universität München, 80333 Munich, Germany (Breitkreutz, S.; Kiermaier, J.; Yilmaz, C.; Schmitt-Landsiedel, D.; Becherer, M.) |
| Abstract | A compact model for the design of nanomagnetic logic based on experiments with field-coupled nanomagnets is presented. Two different types of dots for signal propagation in a wire and logic operations in a majority gate are introduced. The switching behavior and the interaction of fabricated nanomagnets is analyzed by MOKE measurements. Partial irradiation with a focused ion beam (FIB) is used to influence the switching and the interaction of the utilized nanomagnets. Experimental results are used to calibrate the nanomagnetic compact models. Investigations on nanomagnetic wires and an XOR gate are performed. Simulations show that the error rate mainly depends on the switching field variations from dot to dot and the strength of the coupling field between the dots. High coupling fields by small gaps between the nanomagnets and accurate control of switching field variations by partial FIB irradiation turn out to be the key for realizing reliable NML systems. |
| Starting Page | 1248 |
| Ending Page | 1251 |
| File Size | 207812 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781457715143 |
| ISSN | 19449399 |
| e-ISBN | 9781457715167 |
| e-ISBN | 9781457715150 |
| DOI | 10.1109/NANO.2011.6144542 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-08-15 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Switches Couplings Logic gates Wires Error analysis Radiation effects Magnetization |
| Content Type | Text |
| Resource Type | Article |
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