NDLI: Whole-chip ESD protection strategy for CMOS integrated circuits in nanotechnology

Content Provider	IEEE Xplore Digital Library
Author	Ming-Dou Ker Hsin-Chin Jiang
Copyright Year	2001
Description	Author affiliation: Integrated Circuits & Syst. Lab., Nat. Chiao-Tung Univ., Taiwan (Ming-Dou Ker)
Abstract	On-chip electrostatic discharge (ESD) protection circuits are built in IC chips to protect the devices and circuits against ESD damage. But, ESD protection circuits constructed with scaled-down CMOS devices are very susceptible to ESD stress. Therefore, novel ESD protection solutions must be developed to overcome this reliability challenge for integrated circuits fabricated in nano-scale CMOS technology. The whole-chip ESD protection strategy for CMOS integrated circuits in nanotechnology has been proposed with two main methods. One is the substrate- triggered circuit technique used to effectively improve ESD robustness of devices in the nano-scale CMOS technology. The other is the novel design concept of "ESD buses" used to solve the internal ESD damage issue of CMOS IC with multiple and separated power lines. The internal circuits or interface circuits, realized by nano-scale CMOS devices, are more sensitive to such internal ESD damage issue. By using ESD buses, ESD current can be quickly discharged far away from the internal circuits or interface circuits of CMOS IC to achieve the goal of whole-chip ESD protection.
Sponsorship	IEEE Robotics & Autom. Soc. (RAS)
Starting Page	325
Ending Page	330
File Size	1022475
Page Count	6
File Format	PDF
ISBN	0780372158
DOI	10.1109/NANO.2001.966442
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-10-30
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electrostatic discharge Protection CMOS integrated circuits CMOS technology Integrated circuit technology Nanoscale devices Stress Integrated circuit reliability Nanotechnology Robustness
Content Type	Text
Resource Type	Article

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