NDLI: Detection and Root Cause Analysis of Memory-Related Software Aging Defects by Automated Tests

Content Provider	IEEE Xplore Digital Library
Author	Langner, F. Andrzejak, A.
Copyright Year	2013
Description	Author affiliation: Inst. of Comput. Sci., Heidelberg Univ., Heidelberg, Germany (Langner, F.; Andrzejak, A.)
Abstract	Memory-related software defects manifest after a long incubation time and are usually discovered in a production scenario. As a consequence, this frequently encountered class of so-called software aging problems incur severe follow-up costs, including performance and reliability degradation, need for workarounds (usually controlled restarts) and effort for localizing the causes. While many excellent tools for identifying memory leaks exist, they are inappropriate for automated leak detection or isolation as they require developer involvement or slow down execution considerably. In this work we propose a lightweight approach which allows for automated leak detection during the standardized unit or integration tests. The core idea is to compare at the byte-code level the memory allocation behavior of related development versions of the same software. We evaluate our approach by injecting memory leaks into the YARN component of the popular Hadoop framework and comparing the accuracy of detection and isolation in various scenarios. The results show that the approach can detect and isolate such defects with high precision, even if multiple leaks are injected at once.
Sponsorship	IEEE
Starting Page	365
Ending Page	369
File Size	173681
Page Count	5
File Format	PDF
ISBN	9780769551029
ISSN	15267539
DOI	10.1109/MASCOTS.2013.53
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-08-14
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Software Aging Resource management Memory management Java Instruments Monitoring Automated Debugging Software Aging Memory Leaks Automated Testing
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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