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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Mizuno, S. Naito, K. Tateno, Y. Sano, S. Tokumitsu, T. |
| Copyright Year | 2006 |
| Description | Author affiliation: Eudyna Devices Inc., Yamanashi (Mizuno, S.; Naito, K.; Tateno, Y.; Sano, S.; Tokumitsu, T.) |
| Abstract | A novel instability-probing simulation for power amplifiers is presented. Instabilities of power amplifiers with use of very-high performance pHEMT should be observed from a single-gate pHEMT among the multi-gate configuration of the pHEMT, where the power amplifiers are not yet symmetric. A conventional orthogonal (even- and odd-) mode analysis, based on the symmetric power combining, is not complete to predict various instabilities in the power amplifiers. This paper demonstrates a novel instability-probing simulation method that incorporates an ideal transformer. The proposed method successfully predicted microwave and millimeter-wave spurious oscillations observed for a Ku-band MMIC power amplifier |
| Starting Page | 1284 |
| Ending Page | 1287 |
| File Size | 3564124 |
| Page Count | 4 |
| File Format | |
| ISBN | 2960055160 |
| DOI | 10.1109/EUMC.2006.281231 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-09-10 |
| Publisher Place | UK |
| Access Restriction | Subscribed |
| Rights Holder | EUROPEAN MICROWAVE ASSOCIATION |
| Subject Keyword | Power amplifiers MMICs PHEMTs Microwave amplifiers Impedance Radio frequency Microwave devices Microwave theory and techniques Reflection Circuits multi-gate pHEMT spurious oscillation probing power amplifiers |
| Content Type | Text |
| Resource Type | Article |
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