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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Sainju, D. Van den Oever, P.J. Podraza, N.J. Syed, M. Stoke, J.A. Chen, J. Yang, X. Deng, X. Collins, R.W. |
| Copyright Year | 2006 |
| Description | Author affiliation: Dept. of Phys. & Astron., Toledo Univ., OH (Sainju, D.) |
| Abstract | Back-reflector (BR) fabrication for thin film Si solar cells has been studied using real time spectroscopic ellipsometry (SE) with a rotating compensator instrument. The structure explored here is relevant for the substrate/ BR/n-i-p configuration and consists of opaque Ag followed by ~1500 Aring of ZnO, both prepared by sputtering. The thickness of the initial roughness layer on the Ag has been varied from 6 to 55 Aring to investigate its effects on interface formation between Ag and ZnO in the specular regime. The dielectric functions $epsiv=epsiv_{1}+iepsiv_{2}$ of all layers including an observed Ag/ZnO interface layer have been determined, and the latter has been fit using (i) a free electron component, (ii) a plasmon component near 2.8 eV, and (iii) a bound electron component with an absorption onset near 3.7 eV. The measured reflectance spectra of the final specular BR structures with ~1500 Aring thick ZnO are consistent with those predicted from SE models and allow one to identify the physical origins of losses. A strong minimum in reflectance centered at 2.6 eV and an associated tail extending to 1.6 eV is found to be caused by interference-enhanced plasmon absorption. Simulations for thicker ZnO $(d_{b}=3000$ Aring) demonstrate that the dominant loss from 1.2 to 1.5 eV is due to intrinsic absorption in Ag, also enhanced by interference |
| Sponsorship | IEEE Electron Devices Soc |
| Starting Page | 1732 |
| Ending Page | 1735 |
| File Size | 1026472 |
| Page Count | 4 |
| File Format | |
| ISBN | 1424400163 |
| DOI | 10.1109/WCPEC.2006.279826 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-05-07 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Optical films Optical losses Zinc oxide Semiconductor thin films Photovoltaic cells Absorption Sputtering Electrons Plasmons Reflectivity |
| Content Type | Text |
| Resource Type | Article |
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