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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | MacLean, J. Tsotsos, J. |
| Copyright Year | 2000 |
| Description | Author affiliation: Dept. of Comput. Sci., Toronto Univ., Ont., Canada (MacLean, J.) |
| Abstract | A new technique for fast pattern recognition using normalized grey-scale correlation (NGC) is described. While NGC has traditionally been slow due to computational intensity issues, the introduction of both a pyramid structure and a local estimate of the correlation surface gradient allows for recognition in 10-50 ms using modest microcomputer hardware. The algorithm is designed to analyze the target off-line prior to starting the search. Issues surrounding determining an appropriate depth for the pyramid representation and performing sub-pixel localization of the target instance are discussed. The speed and robustness of the method makes it attractive for industrial applications. |
| Starting Page | 873 |
| Ending Page | 877 |
| File Size | 662094 |
| Page Count | 5 |
| File Format | |
| ISBN | 0769507506 |
| ISSN | 10514651 |
| DOI | 10.1109/ICPR.2000.906213 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2000-09-03 |
| Publisher Place | Spain |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Pattern recognition Hardware Microcomputers Computer science Algorithm design and analysis Pattern matching Robustness Manufacturing industries Cameras Image recognition |
| Content Type | Text |
| Resource Type | Article |
| Subject | Computer Vision and Pattern Recognition |
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