NDLI: Pressure tolerant electronics

Content Provider	IEEE Xplore Digital Library
Author	Holzschuh, J.E.
Copyright Year	1974
Description	Author affiliation: Naval Undersea Center, San Diego, CA, USA (Holzschuh, J.E.)
Abstract	This paper is a brief review of progress made toward a usable PTE technology at the Naval Undersea Center, Hawaii. It focuses especially on two of the current problem areas: power transistors and hybrid circuits. Results of COSMOS testing are also included. In earlier tests on plastic encapsulated power transistors a dominant failure mode, cracking of the transistor chip, was identified. Its cause was determined and methods were developed to identify devices subject to this failure mode. Currently, metal hermetic-cased power transistors are being opened and subjected directly to the pressurization liquid. Types tested include single, double, and triple diffused mesas, epitaxials and planars. Three fluids are used: a hydrocarbon oil, Shell Tellus 15; a silicone oil, Dow Coming DC 200-20; and a fluorinert chemical, 3M FC43. Two problems in using hybrid circuitry for pressure tolerant electronics were voids in the substrate-to-header bond and the deformation of the hybrid package. How these problems were solved is covered, as are methods to fill and seal hybrid packages.
Starting Page	190
Ending Page	194
File Size	887399
Page Count	5
File Format	PDF
DOI	10.1109/OCEANS.1974.1161449
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1974-08-21
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Power transistors Bonding Circuit testing Electronic equipment testing Electronics packaging Manufacturing Chemicals Electronic components Petroleum Oceans
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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