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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Sieiro, J. Lopez-Villegas, J.M. Vidal, M.N. Osorio, J.A. Carrasco, T. Ahyoune, S. |
| Copyright Year | 2012 |
| Description | Author affiliation: Grup de Radiofreqüència, Facultat de Física - Universitat de Barcelona, Martí Franquès 1, 08028, Spain (Sieiro, J.; Lopez-Villegas, J.M.; Vidal, M.N.; Osorio, J.A.; Carrasco, T.; Ahyoune, S.) |
| Abstract | An ab initio technique for the meshing of planar radiofrequency and microwave circuits is described in this work. It is based on the analytical study of the current crowding phenomena that takes place inside the component. By using the mutual coupling inductive terms between metal strips, the ratio of the AC resistance due to proximity effects over the DC resistance can be evaluated for each metal strip. In such evaluation, it is not required an explicit solution of currents and charges at any part of the circuit. Then, the number of mesh cells assigned to a given metal strip depends on the value of the ratio. This technique is applied to the computation of losses in high Q inductors implemented in a Low Temperature Co-fired Ceramics Technology. |
| Starting Page | 791 |
| Ending Page | 794 |
| File Size | 709610 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781467322157 |
| e-ISBN | 9782874870279 |
| e-ISBN | 9782874870262 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-10-29 |
| Publisher Place | Netherlands |
| Access Restriction | Subscribed |
| Rights Holder | EUROPEAN MICROWAVE ASSOC |
| Subject Keyword | Strips Metals Inductors Proximity effects Resistance Couplings Integrated circuit modeling LTCC Numerical methods meshing PEEC current crowding planar RF circuit planar microwave circuit inductor transformer |
| Content Type | Text |
| Resource Type | Article |
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