NDLI: Mobilities and diffusion parameters of $Xe^{+}$ ions in Xe-Ne mixtures

Content Provider	IEEE Xplore Digital Library
Author	Barata, J.A.S. Conde, C.A.N.
Copyright Year	2011
Description	Author affiliation: Departamento de Física da Universidade da Beira Interior, P-6201-001 Covilhã, Portugal (Barata, J.A.S.) \|\| Departamento de Física da Universidade de Coimbra, P-3004-516, Portugal (Conde, C.A.N.)
Abstract	Monte Carlo simulations are preformed to calculate ion transport parameters. Results are presented for the calculated reduced mobilities, K, and longitudinal, D, and transverse, D, diffusion coefficients, for $Xe^{+}$ ions in gaseous Xe-Ne mixtures, at atmospheric pressures, for Ne concentrations between 1 and 10%, and reduced electric field strengths, E/N, from about 5 to 500 Td, corresponding to values of E/p, from about 1.66 to 166 V $cm^{−1}$ $Torr^{−1}$ at 293 K. Reduced mobility, K, peaks at about 50 Td with values of about 0.50 $cm^{2}V^{−1}s^{−1}$ and increases slightly with the Ne concentration. The diffusion coefficients remain approximately constant and equal to 0.013 or 0.014 $cm^{2}s^{−1}$ for E/p values up to about 100 Td. The Monte Carlo simulations use a set of integral and differential elastic collision cross sections for $Xe^{+}$ ions with neutral Xe and Ne atoms. Integral and differential elastic collision cross-sections for $Xe^{+}$ ions with neutral Ne atoms are also calculated, and reported for center-of-mass energies in the 1 meV to 10 eV range, using a Tang and Toennies ion-atom interaction potential model to describe ab initio spectroscopic data for the $Xe^{+}-Ne$ molecular ion, and the phase shifts are calculated by the JWKB approximation.
Starting Page	1795
Ending Page	1798
File Size	886054
Page Count	4
File Format	PDF
ISBN	9781467301183
ISSN	10823654
e-ISBN	9781467301206
DOI	10.1109/NSSMIC.2011.6154685
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-10-23
Publisher Place	Spain
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Xenon Approximation methods
Content Type	Text
Resource Type	Article

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