NDLI: Performance evaluation of a flat-panel detector-based microtomography system for small-animal imaging

Content Provider	IEEE Xplore Digital Library
Author	Ho Kyung Kim Sang Chul Lee In Kon Chun Myung Hye Cho Min Hyoung Cho Soo Yeol Lee Koan Sik Joo Gyuseong Cho
Copyright Year	2004
Description	Author affiliation: Kyung Hee Univ., Kyungki, South Korea (Ho Kyung Kim; Sang Chul Lee; In Kon Chun; Myung Hye Cho; Min Hyoung Cho; Soo Yeol Lee)
Abstract	We have applied a flat-panel detector to an X-ray cone-beam micro computed tomography (micro-CT) for small-animal imaging. The flat-panel detector consists of an active matrix of transistors and photodiodes with a pixel pitch of 50 /spl mu/m and a thallium-doped cesium iodide (CsI:Tl) scintillator as an X-ray-to-light conversion layer. The detector was fabricated with a CMOS (complementary metal-oxide-semiconductor) technology capable of a sub-micrometer design line width, hence, it has a pixel fill-factor as high as /spl sim/80%. In addition, the detector has a very fast response characteristic with an image lag being less than 0.3% in the frame integration time of 5 s. Characterization of the CMOS flat-panel detector has been performed in terms of modulation transfer function (MTF), noise power spectrum (NPS), and detective quantum efficiency (DQE). Tomographic imaging performances of the micro-CT system, such as, voxel noise, contrast-to-noise ratio (CNR), and spatial resolution, have also been evaluated by using various quantitative phantoms. Experimental results of euthanized laboratory rat imaging suggest that the micro-CT system employing a CMOS flat-panel detector can be greatly used in small-animal imaging.
Starting Page	2108
Ending Page	2113
File Size	1813552
Page Count	6
File Format	PDF
ISBN	0780382579
ISSN	10823654
DOI	10.1109/NSSMIC.2003.1352296
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-10-19
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	X-ray imaging Optical imaging X-ray detection X-ray detectors CMOS technology Computed tomography Photodiodes Image converters Active matrix technology Transfer functions
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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