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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Camarda, G.S. Kakuno, E.M. Carini, G. Bolotnikov, A.E. Wright, G.W. James, R.B. Siddons, D.P. |
| Copyright Year | 2004 |
| Description | Author affiliation: Nat. Synchrotron Light Source, Brookhaven Nat. Lab., Upton, NY, USA (Camarda, G.S.; Kakuno, E.M.) |
| Abstract | We had begun a program to develop CZT-based detectors optimized for synchrotron radiation (SR) applications. We have made a large number of pixellated and strip detectors with each element having a performance similar to that of individual commercial detectors. On the macroscopic scale it seems very hard to find a systematic correlation between performance and material defects, probably because of local stoichiometry variations and other local disordering. In order to understand the factors limiting the energy resolution of CZT X-ray detectors, our efforts were directed to the area of material characterization and detector testing using the National Synchrotron Light Source (NSLS). NSLS provides us with a highly collimated high intensity X-ray beam, which is employed to perform micro-scale stoichiometry measurement using the SR beam to excite fluorescence and using the characteristic line intensities to measure concentration. Micron-scale detector performance mapping is performed to measure the correlation between microscopic defects and fluctuations in collected charge. |
| Starting Page | 3503 |
| Ending Page | 3506 |
| File Size | 830248 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780382579 |
| ISSN | 10823654 |
| DOI | 10.1109/NSSMIC.2003.1352666 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-10-19 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Strips Strontium X-ray detectors Performance evaluation Radiation detectors Synchrotron radiation Energy resolution X-ray detection Materials testing Light sources |
| Content Type | Text |
| Resource Type | Article |
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