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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Martin, C.E. Rogers, S.K. Ruck, D.W. |
| Copyright Year | 1994 |
| Description | Author affiliation: Dept. of Electr. & Comput. Eng., Wright Res. & Dev. Center, Wright-Patterson AFB, OH, USA (Martin, C.E.; Rogers, S.K.; Ruck, D.W.) |
| Abstract | A neural network approach to obtaining upper and lower bounds on the Bayes error rate for pattern recognition problems is presented. The approach is developed using the key concept of resubstitution and leave-one-out testing from conventional nonparametric error estimation techniques. The neural network approach is evaluated by applying it to several eight-dimensional, two-class "toy" problems, where the Bayes error rate is known. The upper bound of the Bayes error rate is reliably found for problems with complex decision boundary surfaces. Alternative testing approaches are suggested for reducing the difference between the bounds and the true Bayes rate. |
| Starting Page | 305 |
| Ending Page | 308 |
| File Size | 371216 |
| Page Count | 4 |
| File Format | |
| ISBN | 078031901X |
| DOI | 10.1109/ICNN.1994.374180 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1994-06-28 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Neural networks Error analysis Pattern recognition Upper bound Benchmark testing Density functional theory Density measurement Probability density function Estimation theory Multilayer perceptrons |
| Content Type | Text |
| Resource Type | Article |
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