NDLI: A behavioral approach to testability of neural networks

Content Provider	IEEE Xplore Digital Library
Author	Piuri, V. Sami, M.G. Sciuto, D. Stefanelli, R.
Copyright Year	1992
Description	Author affiliation: Dipartimento di Elettronica, Politecnico di Milano, Italy (Piuri, V.; Sami, M.G.; Sciuto, D.; Stefanelli, R.)
Abstract	When dedicated VLSI devices implementing application-specific neural networks are considered, the problem of testability evaluation and test pattern generation has to be solved. The authors analyze the abstract behavioral model of a class of neural networks (namely, feed-forward, multi-layered ones) with the aim of defining a general frame for testability evaluation and test pattern definition. Given such general results, for any given implementation it is sufficient to identify mapping between the behavioral error model and the physical fault model in order to evaluate the actual fault coverage that can be achieved and to identify a strategy for test pattern generation. When a particular silicon implementation is envisioned it is sufficient to map the actual physical faults onto the abstract error model in order to mathematically derive the testability conditions for the specific circuit.
Starting Page	654
Ending Page	659
File Size	390412
Page Count	6
File Format	PDF
ISBN	0780305590
DOI	10.1109/IJCNN.1992.226913
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1992-06-07
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Neural networks Circuit faults Test pattern generators Fault diagnosis Circuit testing Very large scale integration Pattern analysis Multi-layer neural network Feedforward neural networks Feedforward systems
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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