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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Flores-Godoy, J.-J. Yan Wang Collins, D.W. Hoppensteadt, F. Tsakalis, K. |
| Copyright Year | 1998 |
| Description | Author affiliation: Coll. of Eng. & Appl. Sci., Arizona State Univ., Tempe, AZ, USA (Flores-Godoy, J.-J.) |
| Abstract | This Multiscale Integration of Manufacturing and Assembly Processes (MIMAP) demonstration project investigates the integration of two or more Thrust Area Groups (TAGs) by creating a flow of information and processes from two areas of research. The control theory research of two different controllers for diffusion furnaces used in semiconductor manufacturing which predict a specific window of machine failure, the mean-time-before-failure (MTBF). The objective is to increase yield, decrease cycle time, work-in-progress (WIP) and production costs. A global factory Minimum Inventory Variability Scheduling policy (MIVP(R)), used to decrease cycle time and cycle time variance when compared to a first-in-first-out (FIFO) scheduling policy, was used to make the comparisons between the two inner and outer loop controllers. The project's Cross Cutting Methodologies (CCMs) is ensured by the participation of faculty from three different colleges (LAS, CEAS, and CTAS) and two electrical engineering doctoral students. |
| Starting Page | 253 |
| Ending Page | 258 |
| File Size | 656519 |
| Page Count | 6 |
| File Format | |
| ISBN | 0780345037 |
| DOI | 10.1109/IECON.1998.724006 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1998-08-31 |
| Publisher Place | Germany |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Job shop scheduling Semiconductor device manufacture Manufacturing processes Assembly Control theory Furnaces Costs Production facilities Educational institutions Electrical engineering |
| Content Type | Text |
| Resource Type | Article |
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