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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Sommer, V. Albert, P.-B. Zerbe, T. Schnell, A. Mesquida Kusters, A. Heime, K. |
| Copyright Year | 1994 |
| Description | Author affiliation: Inst. fur Halbleitertech., Tech. Hochschule Aachen, Germany (Sommer, V.; Albert, P.-B.; Zerbe, T.; Schnell, A.; Mesquida Kusters, A.; Heime, K.) |
| Abstract | Modern HFETs exhibit very low microwave noise due to the spatial separation of the donor layer and the channel. However, these devices suffer from their low frequency (LF) noise, which limits their applicability both as mixers and as wideband amplifiers. We are interested in the characterization and localization of LF-noise sources in InP/InGaAs/InP HFETs. Because the noise contribution of the aluminium DX-centers is eliminated, we believe that the measured 1/f-noise mainly results from the InP/InGaAs hetero interfaces, especially from the lower one, caused by the less stable InP surface. Furthermore, deep traps may be located at the interfaces due to the gradual transition of the alloy composition. To detect these deep traps, the evaluation of LF-noise spectra seems to be a very promising method. Compared to DLTS; it offers several advantages, since the measurements may be performed near the thermodynamic equilibrium and the effect of gate-source voltage V, variations can be studied. Besides, DLTS is an indirect method and some deep levels detected with it may not contribute to the noise. |
| Starting Page | 415 |
| Ending Page | 418 |
| File Size | 322041 |
| Page Count | 4 |
| File Format | |
| ISBN | 078031476X |
| DOI | 10.1109/ICIPRM.1994.328258 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1994-03-27 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Low-frequency noise Indium phosphide HEMTs MODFETs Indium gallium arsenide Microwave devices Frequency Broadband amplifiers Aluminum Noise measurement |
| Content Type | Text |
| Resource Type | Article |
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