NDLI: Face detection and landmark localization using Bilayer Tree Structured Model

Content Provider	IEEE Xplore Digital Library
Author	Gee-Sern Hsu Kai-Hsiang Chang Shih-Chieh Huang Sheng-Luen Chung
Copyright Year	2015
Description	Author affiliation: Dept. of Electr. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan (Sheng-Luen Chung) \|\| Artificial Vision Lab., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan (Gee-Sern Hsu; Kai-Hsiang Chang; Shih-Chieh Huang)
Abstract	Although the Tree Structured Model (TSM) is proven effective for face detection, pose estimation and landmark localization, its sluggish runtime makes it unfavorable in practical applications. We propose the Bilayer Tree Structure Model (BTSM) to improve the run-time speed while keeping the performance unchanged or slightly better. The BTSM is composed of two component TSMs, the coarse c-TSM and the refined r-TSM. The c-TSM is trained on low-resolution samples so that it can provide coarse but fast detection, The r-TSM is trained on mid-resolution samples so that it can locate precise part locations. The performance of the BTSM is validated on three benchmark databases, the Multi-PIE, LFPW and AFW, and compared with the latest TSM to demonstrate its efficacy.
Starting Page	4303
Ending Page	4307
File Size	1610139
Page Count	5
File Format	PDF
e-ISBN	9781479983391
DOI	10.1109/ICIP.2015.7351618
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-09-27
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Face Training Face detection Shape Computational modeling Detectors Deformable Part Model Face Detection Facial Landmark Localization
Content Type	Text
Resource Type	Article

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