NDLI: Single pass polarimetric SAR interferometry

Content Provider	IEEE Xplore Digital Library
Author	Yunjin Kim van Zyl, J.
Copyright Year	1998
Description	Author affiliation: Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA (Yunjin Kim)
Abstract	During the past ten years, the NASA/JPL AIRSAR system has produced polarimetric and interferometric SAR data. SAR polarimetry is useful for characterizing scattering mechanisms while SAR interferometry yields high resolution topographic maps. For bare surfaces, the interferometric SAR topography represents true ground height. However, the radar height is biased by the volume scattering contribution from tree canopies for vegetated areas. Recently, S.R. Cloude and K.P. Papathanassiou (1997) developed a new radar technique called polarimetric SAR interferometry. This technique can produce a radar topographic map corresponding to a particular scattering mechanism. In this way, both true ground height and tree height may be derived. The NASA/JPL AIRSAR will be upgraded to collect the C-band polarimetric SAR interferometric data in May, 1998. In this work, the hardware modifications required for this upgrade are presented. Since the data are collected in the single pass interferometric mode, one can study various combinations of interferometric/polarimetric data without suffering temporal decorrelation. Both theoretical and preliminary test results are discussed.
Starting Page	2190
Ending Page	2191
File Size	161503
Page Count	2
File Format	PDF
ISBN	0780344030
DOI	10.1109/IGARSS.1998.703782
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-07-06
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Interferometry Radar scattering Radar polarimetry Decorrelation Bandwidth Synthetic aperture radar Backscatter Propulsion Laboratories Surface topography
Content Type	Text
Resource Type	Article

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