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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Bedekar, A.S. Haralick, R.M. |
| Copyright Year | 1995 |
| Description | Author affiliation: Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA (Bedekar, A.S.; Haralick, R.M.) |
| Abstract | The problems of finding corresponding points from multiple perspective projection images, and estimating the 3-D points from which these points have arisen, are addressed. The problem of finding corresponding points is formulated as a hypothesis verification problem. Given a set of 2-D points, one from each of N perspective projection images, under the hypothesis that the points are projections of the same 3-D point, the coordinates of the 3-D point are estimated. The triangulation problem-the problem of estimating the coordinates of a 3-D point, given its projections in N perspective projection images-is posed as a Bayesian estimation problem, taking into account the uncertainties in the observed image points and the camera parameters. Based on the Bayesian estimate of the triangulated point, a statistical test is derived for verifying the hypothesis that the given set of image points is in correspondence. For finding N-tuples of corresponding points from N perspective projection images, this test can be used on each N-tuple of points to verify the hypothesis that that N-tuple of points is in correspondence, selecting those N-tuples that pass the hypothesis test. Experiments are described for characterizing the distance of the 3-D point estimated by the Bayesian triangulation from the true 3-D point, and characterizing the misdetection and false alarm rates of this method of finding corresponding points. |
| Starting Page | 362 |
| Ending Page | 365 |
| File Size | 357666 |
| Page Count | 4 |
| File Format | |
| ISBN | 0818673109 |
| DOI | 10.1109/ICIP.1995.537490 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1995-10-23 |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Bayesian methods Testing Cameras Uncertainty Layout Covariance matrix Bipartite graph |
| Content Type | Text |
| Resource Type | Article |
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