NDLI: Quantitative electro-optic sampling for high-speed characterisation of passive and active devices

Content Provider	IEEE Xplore Digital Library
Author	Allam, J. Yuca, C.L. Cleaver, J.R.A.
Copyright Year	1999
Description	Author affiliation: Hitachi Cambridge Lab., Cavendish Lab., UK (Allam, J.)
Abstract	We report our recent progress on the high-speed sampling of passive circuit elements and active electronic devices. Using optical excitation of picosecond photoconductors and electro-optic sampling, bandwidths of 300-400 GHz and a signal to noise ratio /spl square/60 dB are attainable. By exploiting the spatio-temporal symmetries of coplanar waveguide, the pulses resulting from quasi-TEM CPW modes can be isolated from parasitic slot and slab modes. The stimulus and response were separated using a procedure which avoids 'arbitrary' time-windowing of forward and reflected pulses. The role of probe invasiveness in run-to-run repeatability was identified. Using such methods, we expect that quantitative electro-optic sampling at the few % level can be realised. These methods were used to measure S-parameters of 'standard' impedances for vector network analysers and passive circuit elements including airbridges. Approaches to the high frequency measurement of active devices including 0.1 /spl mu/m T-gate PHEMTs is also discussed.
Starting Page	20
Ending Page	26
File Size	560725
Page Count	7
File Format	PDF
ISBN	078035298X
DOI	10.1109/EDMO.1999.821454
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-11-23
Publisher Place	United Kingdom
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Sampling methods Passive circuits Optical waveguides Coplanar waveguides High speed optical techniques Optical devices Optical noise Photoconductivity Bandwidth Signal to noise ratio
Content Type	Text
Resource Type	Article

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