NDLI: Front cover

Please wait, while we are loading the content...

Proceedings of the 2015 International Conference on Microelectronic Test Structures

2014 International Conference on Microelectronic Test Structures (ICMTS)

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)

2012 IEEE International Conference on Microelectronic Test Structures

2011 IEEE ICMTS International Conference on Microelectronic Test Structures

Admittance characterization and interface trap property extraction for Ge/III-V MOS structures

Front-end-of-line quadrature-clocked voltage-dependent capacitance measurement

Evaluation of MOSFET C-V curve variation using test structure for charge-based capacitance measurement

Modeling the frequency dependence of MOSFET gate capacitance

A simple system for on-die measurement of atto-Farad capacitance

A versatile defectivity monitor designed for efficient test and failure analysis

Low cost wafer level parallel test strategy for reliability assessments in sub-32nm technology nodes

Product relevant device leakage scribe characterization vehicle test chip for efficient full wafer testing

Improved parameter extraction procedures for the R3 model

Contact resistance measurement structures for high frequencies

Strategy for in-line MOS transistor transport optimization

Characterisation of electroplated NiFe films using test structures and wafer mapped measurements

Exploring capacitance-voltage measurements to find the piezoelectric coefficient of aluminum nitride

Interdigitated electrode modelling for applications in dielectrophoresis

Test structures and a measurement system for characterising the lifetime of EWOD devices

Decoupling of RTS noise in high density CMOS image sensor using new test structures

Microsecond pulsed DC matching measurements on MOSFETs in strong and weak inversion

Nonlinear network analyzer measurements for better transistor modeling

Silicon high frequency test structures improvement for millimeter wave varactors characterization optimization and modeling

Innovative thin film deposition technologies enabling new materials and new device integration roadmaps

Lateral bipolar structures for evaluating the effectiveness of surface doping techniques

Electrical estimation of channel dopant uniformity using test MOSFET array

An efficient array structure to characterize the impact of through silicon vias on FET devices

New test structure for evaluating low-k dielectric interconnect layers by using ring-oscillators and metal comb/serpentine patterns

Characterization and modelling of gate current injection in embedded non-volatile flash memory

Gated diode in breakdown voltage collapse regime — A test vehicle for oxide characterization

Experimental procedure for accurate trap density study by low frequency charge pumping measurements

Device variability and correlation control by automated tuning of SPICE cards to PCM measurements

Variation-sensitive monitor circuits for estimation of Die-to-Die process variation

Simple current and capacitance methods for bulk finFET height extraction and correlation to device variability

Gap-closing test structures for temperature budget determination

High temperature on-wafer measurement structure for DMOS characterization

Design of a test chip with small embedded temperature sensor structures realized in a common-drain power trench technology

Scalable thermal resistance model for single and multi-finger silicon-on-insulator MOSFETs

Matching characteristics of metal resistors

Radiation effects upon the mismatch of identically laid out transistor pairs

Novel BJT test structure for high-performance matching characteristics in CMOS-based analog applications

Sensing mobility mismatch due to local interconnect mechanical stress in CMOS technology

2010 International Conference on Microelectronic Test Structures (ICMTS)

2009 IEEE International Conference on Microelectronic Test Structures

2008 IEEE International Conference on Microelectronic Test Structures

2007 IEEE International Conference on Microelectronic Test Structures

2006 IEEE International Conference on Microelectronic Test Structures

Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005.

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516)

International Conference on Microelectronic Test Structures, 2003.

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002.

ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153)

ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)

ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)

ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157)

1997 IEEE International Conference on Microelectronic Test Structures Proceedings

Proceedings of International Conference on Microelectronic Test Structures

Proceedings International Conference on Microelectronic Test Structures

Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures

ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures

International Conference on Microelectronic Test Structures

Proceedings of the 1991 International Conference on Microelectronic Test Structures

Proceedings of the 1989 International Conference on Microelectronic Test Structures

Proceedings of the IEEE International Conference on Microelectronic Test Structures

Central Library (ISO-9001:2015 Certified)
Indian Institute of Technology Kharagpur
Kharagpur, West Bengal, India | PIN - 721302

See location in the Map
03222 282435
Mail: support@ndl.gov.in

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in