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  1. IEEE International Workshop on Memory Technology, Design and Testing.
  2. Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing
  3. Challenges in memory-logic integration
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2009 IEEE International Workshop on Memory Technology, Design, and Testing
2007 IEEE International Workshop on Memory Technology, Design and Testing
2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06)
2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05)
Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004.
Records of the 2003 International Workshop on Memory Technology, Design and Testing
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)
Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing
Records of the IEEE International Workshop on Memory Technology, Design and Testing
Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing
Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. No.98TB100236)
Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. NO.97TB100159)
IEEE International Workshop on Memory Technology, Design and Testing,
Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing
Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing
Challenges in memory-logic integration
Modeling application specific memories
A modeling and circuit reduction methodology for circuit simulation of DRAM circuits
A new serial sensing approach for multistorage non-volatile memories
Embedded RAM testing
A bipartite, differential I/sub DDQ/ testable static RAM design
CMOS SRAM test based on quiescent supply current in write operation
Detection of faults in ECL storage elements
Automatic computation of test length for pseudo-random memory tests
An efficient test method for embedded multi-port RAM with BIST circuitry
A 5 Gb/s 9-port application specific SRAM with built-in self test
A 2 cycle 1 Mbit 4 way set associative 4 way interleave multi-processor L2 directory with array access/cycle 2.5 nsec
Optimization of memory organization and hierarchy for decreased size and power in video and image processing systems
Logic-enhanced memories for data-intensive processing
The Rambus memory system
Performance in real-time main-memory databases
Gallium arsenide MESFET memory architectures
Yield and cost estimation for a CAM based parallel processor
Deterministic tests for detecting scrambled pattern-sensitive faults in RAMs
Composition of multiple faults in RAMs
Author index
Proceedings of IEEE International Workshop on Memory Technology, Design, and Test
Records of the 1993 IEEE International Workshop on Memory Testing

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Challenges in memory-logic integration

Content Provider IEEE Xplore Digital Library
Author Prince, B.
Copyright Year 1995
Description Author affiliation: Meomory Strategies Int., Sugarland, TX, USA (Prince, B.)
Abstract This overview paper discusses sore of the system opportunities and the manufacturing costs of integrating large amounts of logic and memory on a single chip.
Starting Page 2
Ending Page 7
File Size 639337
Page Count 6
File Format PDF
ISBN 0818671025
DOI 10.1109/MTDT.1995.518074
Language English
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date 1995-08-07
Access Restriction Subscribed
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword Costs Random access memory Silicon Graphics Drives Pulp manufacturing Paper technology Seminars Logic design Reliability
Content Type Text
Resource Type Article
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