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Content Provider | IEEE Xplore Digital Library |
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Author | Kok-Meng Lee Debao Zhou |
Copyright Year | 2003 |
Description | Author affiliation: The George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA (Kok-Meng Lee; Debao Zhou) |
Abstract | The need for simultaneous measurement of more-than-one degrees-of-freedom (DOF) motions of an object can be found in numerous applications such as robotic assembly, precision machining, optical tracking, wrist actuators, and active joysticks. Conventional single-axis encoders, though capable of providing high-resolution linear or angular measurements, require additional mechanical linkages that often introduce frictions, backlashes, and singularities. In this paper, a non-contact optical sensor for three-DOF orientation measurement is present. Unlike other contemporary designs, which often require a specific pattern to be drawn on a surface, this optical sensor presented here relies only on microscope features on natural surfaces to detect incremental motions. Here we offer a detailed description of the design and the development of a dual-sensor system capable of measuring three-DOF motions in real time. The analysis that is essential for optimizing the sensor design has been validated experimentally. |
Sponsorship | IEEE Robotics & Autom. Soc. IEEE Ind. Electron. Soc. Robotics Soc. Japan Soc. Instrum. & Control Eng. New Technol. Found |
Starting Page | 1596 |
Ending Page | 1601 |
File Size | 471333 |
Page Count | 6 |
File Format | |
ISBN | 0780378601 |
DOI | 10.1109/IROS.2003.1248872 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2003-10-27 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Wrist Optical sensors Optical microscopy Robotic assembly Machining Tracking Actuators Mechanical variables measurement Couplings Friction |
Content Type | Text |
Resource Type | Article |
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