NDLI: Hot-carrier damage in AC-stressed deep submicrometer CMOS technologies

Content Provider	IEEE Xplore Digital Library
Author	Bravaix, A. Goguenheim, D. Revil, N. Vincent, E.
Copyright Year	1999
Description	Author affiliation: ISEM, Toulon, France (Bravaix, A.)
Abstract	We have investigated the degradation behavior of single transistors using DC and AC alternating stress conditions as the interface trap generation and the charge trapping/detrapping phenomena become a competitive interaction during AC cycles in 0.25 /spl mu/m CMOS technologies with 5 nm thick gate-oxide. In this way, we determine to what extent the effects and mechanisms are affecting the resultant degradation behavior between N- and P-MOSFETs in order to explain the degradation observed in actual circuits. The effect of temperature is further investigated between -40/spl deg/C and 125/spl deg/C as Negative Bias Temperature Instability (NBTI), thermal emission, field-enhanced charge detrapping may contribute to the transistor degradation and modify the circuit degradation. We verify the usefulness of the experimental procedure and model based on duty cycle calculations for ring oscillators.
Starting Page	61
Ending Page	65
File Size	449736
Page Count	5
File Format	PDF
ISBN	0780356497
DOI	10.1109/IRWS.1999.830559
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-10-18
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Hot carriers Thermal degradation CMOS technology Stress AC generators DC generators MOSFET circuits Negative bias temperature instability Niobium compounds Titanium compounds
Content Type	Text
Resource Type	Article

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NBTI-channel hot carrier effects in PMOSFETs in advanced CMOS technologies

Interaction of NBTI with Hot Carriers in PMOSFET's for Advanced CMOS Technologies

Negative bias temperature instability of deep sub-micron p-MOSFETs under pulsed bias stress

Impact of substrate bias on p-MOSFET negative bias temperature instability

Mechanism of negative bias temperature instability for PMOSFET's with thin gate oxide

Models of Source/Drain Bias on Negative Bias Temperature Instability

Hot-carrier degradation evolution in deep submicrometer CMOS technologies

Prediction of NBTI degradation for circuit under AC operation

Mechanism of negative bias temperature instability in CMOS devices: degradation, recovery and impact of nitrogen

Hot-carrier damage in AC-stressed deep submicrometer CMOS technologies

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