NDLI: A new approach for predicting AC hot carrier lifetime

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2013 IEEE International Integrated Reliability Workshop Final Report

2012 IEEE International Integrated Reliability Workshop Final Report

2011 IEEE International Integrated Reliability Workshop Final Report

2010 IEEE International Integrated Reliability Workshop Final Report

2009 IEEE International Integrated Reliability Workshop Final Report

2008 IEEE International Integrated Reliability Workshop Final Report

2007 IEEE International Integrated Reliability Workshop Final Report

2006 IEEE International Integrated Reliability Workshop Final Report

2005 IEEE International Integrated Reliability Workshop

IEEE International Integrated Reliability Workshop Final Report, 2004

IEEE International Integrated Reliability Workshop Final Report, 2003

IEEE International Integrated Reliability Workshop Final Report, 2002.

2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580)

2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515)

1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)

1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363)

1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319)

1996 International Integrated Reliability Workshop Final Report

IEEE 1995 International Integrated Reliability Workshop. Final Report

IEEE 1995 International Integrated Reliability Workshop. Final Report

Physics-of-failure: an approach to reliable product development

On the road to building-in reliability

Using CHARM-2 wafers to increase reliability in ion implant processing

Passivation scheme impact on retention reliability of non volatile memory cells

A system engineering approach to the design of on-chip electrostatic discharge protection

Corner point lot qualification technique

A design reliability methodology for CMOS VLSI circuits

Building reliability into an EPROM cell using in-line WLR monitors

A case study in a 100/spl times/reduction in sodium ions in a 0.8 /spl mu/m BiCMOS process using triangular voltage sweep

Implementation of a WLR-program into a production line

A study of EEPROM endurance correlation with wafer level reliability data

Fast detection of mobile ions for WLR monitoring

Detection and measurement of hot carrier degradation associated with asymmetric p-channel transistors

A new physics-based model for time-dependent-dielectric-breakdown

Assessing MOS gate oxide reliability on wafer level with ramped/constant voltage and current stress

F contamination effects on intrinsic and extrinsic gate oxide reliability

Reduced oxide reliability due to multilevel metalization process

Time-dependent dielectric breakdown of intrinsic SiO/sub 2/ films under dynamic stress

Wafer level reliability procedures to monitor gate oxide quality using V ramp and J ramp test methodology

Particulate contamination control in plasma processing: building-in reliability for semiconductor fabrication

A new approach for predicting AC hot carrier lifetime

Fast test at wafer-level for endurance of tunnel oxide

A new method to statistically monitor active area spread and oxide thinning in real devices

Stepped current stressing of line/stud structures

WLR test structure design - Discussion group summary

Implementation of BIR Concepts - Discussion group summary

Discussion group session summary: Package and die interactions

Discussion group summary report: Thin oxide reliability

Detection and analysis of ESD-induced melt filaments for FSRAMs

Assessment of a unipolar pulsed ramp for the characterisation of MOS gate oxide reliability

A new WLR method based on model parameter analysis

A new technique to measure thin oxide thickness in IC manufacturing

Statistical reliability prediction

Building in reliability (BIR) with critical nodes

Simulation of wafer scale diagnosis

WLR fast tests for characterization of a BiCMOS process and identification of mobile ionic contamination

Dielectric step stress and life stress comparison

Migrated copper resistive shorts in plastic encapsulated devices

Reliability prediction through critical area analysis

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)

International Integrated Reliability Workshop Final Report

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