NDLI: Noise and distortion in transient waveform recorders

Content Provider	IEEE Xplore Digital Library
Author	Gorton, R.
Copyright Year	1988
Description	Author affiliation: Planning Res. Corp., Hampton, VA, USA (Gorton, R.)
Abstract	A data-acquisition system that measures transient waveform recorder (TWR) performance and has self-test capability is described. It uses an HP9836 desktop computer with 2 megabytes of RAM storage, a 30-megabyte hard disc and two floppy discs, a ten-bit TWR interfaced on an HPIB interface, and a CAMAC crate capable of housing up to four 12-bit 20-MHz TWRs. A sinewave curve-fit test, used to evaluate the total noise from all measurement sources and arrive at a parameter called 'effective bits', is described. The results of a Fourier transform performed on the sinusoid used in the curve-fit are also presented. A chief objective of all these measurements was to establish the sensitivity, linearity, and noise characteristics of these devices under various conditions, as well as to establish the dynamic performance characteristics of various analog-to-digital converters to be used in the lidar atmosphere sensing equipment (LASE) experiment.
Starting Page	208
Ending Page	211
File Size	300201
Page Count	4
File Format	PDF
DOI	10.1109/IMTC.1988.10851
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1988-04-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Noise measurement Distortion measurement Built-in self-test Computer interfaces Read-write memory Hard disks CAMAC Testing Fourier transforms Atmospheric measurements
Content Type	Text
Resource Type	Article

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