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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kyongho Han Hyun-Do Nam |
| Copyright Year | 1997 |
| Description | Author affiliation: Dedpt. of Electr. Eng., Dankook Univ., Seoul, South Korea (Kyongho Han) |
| Abstract | The design of the maximum number of serial test vectors is proposed for the detection of the short circuit faults of the interconnect wires. The interconnect wires of the circuit board is reconfigured and mapped into several net groups, which are electrically independent from each other. The short circuit faults between the independent net groups generate the responses which is the result of wired-OR or wired-AND operation of the applied test vector sets to the net groups. The test vector is self-detectable if the responses from the faulty net group are different from any set of the applied test vector sets and the short circuit faults are detected by observing the response of the circuit. For the self-detectable vector sets, the previous methods showed the reduced the number of the test vector set. We proposed the maximum number of self-detectable test vector sets and compared with the previous test vector sets. |
| Starting Page | 1253 |
| Ending Page | 1256 |
| File Size | 298449 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780336763 |
| DOI | 10.1109/ICICS.1997.652185 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1997-09-12 |
| Publisher Place | Singapore |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electrical fault detection Circuit testing Fault detection Automatic testing Circuit faults Wires Integrated circuit interconnections Printed circuits Manufacturing Joining processes |
| Content Type | Text |
| Resource Type | Article |
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