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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Haroutunian, E. Yessayan, A. |
| Copyright Year | 2011 |
| Description | Author affiliation: Institute for Informatics and Automation, Problems of NAS of RA, Armenia (Haroutunian, E.; Yessayan, A.) |
| Abstract | This paper is devoted to study of characteristics of logarithmically asymptotically optimal (LAO) hypotheses testing and identification for a model consisting of two related objects. In considered general case of dependence it is supposed that L1 possible probability distributions of states constitute the family of possible hypotheses for the first object and the second object is distributed according to one of L1 × L2 given conditional distributions depending on the distribution index and the current observed state of the first object. By one approach the matrix of interdependencies of all possible pairs of the error probability exponents (reliabilities) of asymptotically optimal tests of distributions of both objects is studied. The identification of the distributions of two objects gives an answer to the question whether r1-th and r2-th distributions occurred, or not on the first and the second objects, correspondingly. Interdependence of reliabilities for the LAO identification is determined for each pair of double hypotheses. By the second approach the optimal interdependencies of lower estimates of all possible pairs of corresponding reliabilities are found and lower estimates of reliabilities for the LAO identification are studied for all pairs of hypotheses. |
| Starting Page | 2671 |
| Ending Page | 2675 |
| File Size | 388801 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781457705960 |
| ISSN | 21578117 |
| e-ISBN | 9781457705953 |
| e-ISBN | 9781457705946 |
| DOI | 10.1109/ISIT.2011.6034056 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-07-31 |
| Publisher Place | Russia |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Testing Reliability theory Computer science Probability distribution Information theory Error probability |
| Content Type | Text |
| Resource Type | Article |
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