NDLI: A standardized excitation approach for classification of buried UXO

Content Provider	IEEE Xplore Digital Library
Author	Shubitidze, F. O'Neill, K. Shamatava, I. Sun, K. Paulsen, K.D.
Copyright Year	2004
Description	Author affiliation: Thayer Sch. of Eng., Dartmouth Coll., Hanover, NH (Shubitidze, F.; O'Neill, K.; Shamatava, I.; Sun, K.; Paulsen, K.D.)
Abstract	In this paper, a new discrimination procedure is presented to enhance classification of buried metallic object. This algorithm is based on a standardized source set (SSS) approximation, applicable for an arbitrary highly conducting and permeable metallic objects placed in a low frequency (from 10's of Hertz up to several 100's of kHz) time varying electromagnetic field. The method treats accurately all near field, heterogeneity, and internal interaction effects. In the SSS approach, any input primary magnetic field is represented as a sum of magnetic fields produced by a set of sources distributed over on an auxiliary surface outside the fictitious surface. The object's response corresponding to unit amplitudes of any of these input field sources is likewise quantified in terms of a set of (responding) sources, which can be derived from measured data. Thereafter, the object's response to any excitation can be expressed just by different superpositions of these standardized inputs. The spatial distribution and frequency dependence features of responding equivalent sources are analyzed and used for target discrimination. The numerical results are given for an actual unexploded ordinance (UXO)
Starting Page	4905
Ending Page	4908
File Size	381439
Page Count	4
File Format	PDF
ISBN	0780387422
DOI	10.1109/IGARSS.2004.1370263
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-09-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electromagnetic interference Electromagnetic fields Magnetic field measurement Surface treatment Costs Dielectric losses Eddy currents Electromagnetic scattering Educational institutions Laboratories
Content Type	Text
Resource Type	Article

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