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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Gulliver, T.A. Narimani, H. Khosravifard, M. |
| Copyright Year | 2009 |
| Description | Author affiliation: Dept. of Elect. & Comp. Engineering, Isfahan University of Technology, 84156-83111, IRAN (Narimani, H.) || Department of Electrical and Computer Engineering, Isfahan University of Technology, 84156-83111, IRAN (Gulliver, T.A.) || Dept. of Electrical & Computer Engineering, University of Victoria, PO Box 3055, STN CSC, BC, V8W 3P6 Canada (Khosravifard, M.) |
| Abstract | For a given memoryless information source, the Huffman code is the optimal prefix-free code in the sense of redundancy. Generally, the length of each codeword in the Huffman code is a function of all symbol probabilities p1, p2, …, pn. In contrast, with the best known suboptimal code, i.e., the Shannon code, the length of the i-th codeword (i.e. [− log pi]) is a function of only pi. In this paper, two recursive versions of the Shannon code (RYY and RSh) are proposed which have redundancy which lies between that of the Huffman code and the Shannon code. In particular, the redundancy is not greater than that of the Shannon code and the i-th codeword length does not depend on pi+1, pi+2, …, pn. In order to evaluate the overall performance of the proposed codes, their redundancy is considered as a random variable on the set of all sources with n symbols. An algorithm for generating random n-tuple distributions is derived and the expected value of the redundancy of the resulting codes is estimated. Recently, it was proven that the average redundancy of the Shannon code is around 0.5 bits. Simulation shows that for n ≫ 20 the average redundancy of the proposed codes are about 0.1 and 0.06, while it is approximately 0.03 for the Huffman code. |
| Starting Page | 209 |
| Ending Page | 213 |
| File Size | 1022499 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781424443123 |
| DOI | 10.1109/ISIT.2009.5205279 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-06-28 |
| Publisher Place | South Korea |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Random variables Information theory Entropy Length measurement Algorithm design and analysis Upper bound |
| Content Type | Text |
| Resource Type | Article |
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