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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Akasaka, Y. Miyagawa, K. Syoji, H. Ogawa, O. Kawahara, T. Horiuchi, A. Mitsuhashi, R. Maeda, T. Muto, A. Kasai, N. Yasuhira, M. Arikado, T. |
| Copyright Year | 2003 |
| Description | Author affiliation: Semicond. Leading Edge Technol. Inc., Tsukuba, Japan (Akasaka, Y.; Miyagawa, K.; Syoji, H.; Ogawa, O.; Kawahara, T.; Horiuchi, A.; Mitsuhashi, R.; Maeda, T.; Muto, A.; Kasai, N.; Yasuhira, M.; Arikado, T.) |
| Abstract | The V/sub th/ shift of a poly-Si/high-k MISFET has been reported. The observed V/sub t/h of p/sup +/ poly-Si/HfAlO/sub x/ or HfSiO/sub x/ is much higher than that of the p/sup +/ poly/SiON MISFET. The controlled V/sub th/ of the PMISFET is strongly required for the application of high-k insulators. In this study, we fabricated HfAlO/sub x/ MISFETs with n/sup +//p/sup +/ poly-Si and TiN gate electrodes by using the same "replacement gate" process. We found that the difference of V/sub fb/ between n/sup +/ poly-Si-/HfAlOx and p/sup +/ poly-Si/HfAlO/sub x/ systems is independent of channel types and much smaller than 1 V i.e. the theoretical difference between the work function of n/sup +/ and p/sup +/ Si. On the other hand, the TiN/HfAlO/sub x/ system shows the appropriate V/sub fb/ expected from work function. |
| Sponsorship | JSAP: Japan Soc. of Appl. Phys. JSAP Thin Film and Surface Phys. Div. JSAP Silicon Technol. Div |
| Starting Page | 94 |
| Ending Page | 95 |
| File Size | 217914 |
| Page Count | 2 |
| File Format | |
| ISBN | 4891140372 |
| DOI | 10.1109/IWGI.2003.159192 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-11-06 |
| Publisher Place | Japan |
| Access Restriction | Subscribed |
| Rights Holder | Japan Society of Applied Physics |
| Subject Keyword | MISFETs Tin Electrodes Channel bank filters Leakage current High K dielectric materials High-K gate dielectrics Insulation Boron Capacitors |
| Content Type | Text |
| Resource Type | Article |
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