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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Bansal, L.K. Patel, P.J. Prahlad, V. Qureshi, K. Patel, V.B. Gupta, L.N. Thakkar, D.P. Sumod, C.B. Vadher, V. Parmar, S. Bharathi, P. Baruah, U.K. |
| Copyright Year | 2013 |
| Description | Author affiliation: Inst. for Plasma Res., Gandhinagar, India (Bansal, L.K.; Patel, P.J.; Prahlad, V.; Qureshi, K.; Patel, V.B.; Gupta, L.N.; Thakkar, D.P.; Sumod, C.B.; Vadher, V.; Parmar, S.; Bharathi, P.; Baruah, U.K.) |
| Abstract | A positive ion neutral injector capable in delivering 5MW (55kV, 90A) ion beam power is being operated for SST-1 neutral beam injection (NBI). SST-1 Neutral beam injection systems has various components on beam line like ion source, neutralizer, deflection magnet, ion dump, beam dump etc. A Thermocouples based diagnostics is being used for Power density distribution, Beam alignment and System protection. Temperature of beam line components rises when beam passes through them. In order to measure the rise in temperature and estimating beam power profile, beam line components are instrumented with thermocouples (TCs). The thermocouples, which are all K (nickel-chromium/nickel-aluminum) type, have their hot junctions on ground so as to respond quickly to temperature changes. Here `the ground' means beam line components, which in turn are connected to the single reference point of the electrical circuit. The beam itself is dumped on these parts so TCs are subject to severe voltage transients up to few hundred volts. We developed a signal conditioning and data acquisition system to measure the voltage developed across the thermocouples due to rise in temperature. This signal conditioning and data acquisition system is capable in truly producing the temperature rise in presence of voltage transients, high voltage switching during breakdowns. Raw signal from each of these thermocouples is first processed in signal condition cards and then acquired on data acquisition system. This paper presents the scheme of signal conditioning system and obtained results in detailed. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 566259 |
| Page Count | 4 |
| File Format | |
| e-ISBN | 9781479901715 |
| DOI | 10.1109/SOFE.2013.6635318 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-06-10 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Noise Ion beams Temperature measurement Power supplies Ion sources Plasma temperature dV/dt Thermocouple signal conditioning NBI calorimeter EMI |
| Content Type | Text |
| Resource Type | Article |
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