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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Luiten, A.N. Mann, A.G. Blair, D.G. |
| Copyright Year | 1993 |
| Description | Author affiliation: Dept. of Phys., Univ. of Western Australia, Nedlands, WA, Australia (Luiten, A.N.; Mann, A.G.; Blair, D.G.) |
| Abstract | It is shown that, in 5 cm Crystal Systems "HEMEX" resonators, unloaded Q values, not limited by wall losses, of 5-8 /spl times/ 10/sup 9/ at 2 K and 3 /spl times/ 10/sup 9/ at 6 K are possible. Frequency-temperature self-compensation, in which the temperature dependence of the real part of the AC susceptibility of paramagnetic impurities balances that due to the dielectric constant of the sapphire, can be achieved in H modes at convenient operating temperatures. Because chromium and iron concentrations are very small, ions with very high frequency ESRs provide essentially frequency-independent self-compensation, allowing freedom of choice of operating frequency. The dominant paramagnetic ion has been identified as Mo/sup 3+/. Since the Mo/sup 3+/ concentration is essentially fixed by the crystal growth process, and one desires the lowest possible frequency-temperature coefficient and dielectric loss, the H/sub m11/ modes are the best candidates for high-stability HEMEX resonators. The observed power dependence of mode frequency, /spl sim/10/sup -8/ W/sup -1/, will require that resonator power fluctuations be maintained at less than 100 nW if a frequency stability of 1 /spl times/ 10/sup -15/ is to be achieved.< |
| Starting Page | 757 |
| Ending Page | 762 |
| File Size | 478843 |
| Page Count | 6 |
| File Format | |
| ISBN | 0780309057 |
| DOI | 10.1109/FREQ.1993.367474 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1993-06-02 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Oscillators Frequency Temperature dependence Paramagnetic materials Dielectric losses Impurities Dielectric constant Chromium Iron Paramagnetic resonance |
| Content Type | Text |
| Resource Type | Article |
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