NDLI: ESD Immunity Test and Several Improvements for Digital Electronic Dictionary

Content Provider	IEEE Xplore Digital Library
Author	Wang Xiqin Huang Jiusheng Gao Yougang Liu Suling Zhou Feng Wang Langfeng
Copyright Year	2006
Description	Author affiliation: Beijing Univ. of Posts & Telecommun. (Wang Xiqin)
Abstract	Electronic devices are getting more and more sensitive to the electro-static discharge (ESD) because of their smaller size and higher frequency. An electronic dictionary device studied here has failed in the ESD immunity test according to the IEC61000-4-2 standard. Many factors which could impact on the ESD immunity performance of the device are investigated in the test and some suggestions are also given in this paper for improving its performance. The improving suggestions are listed and analyzed combining the device in detail in this paper: 1) improving the ESD immunity performance of the dictionary's PCB; 2) changing the outer package material for the dictionary, protecting the LED; and 3) building a complete ESD test system. The device has gained a significant improvement on the ESD immunity by using merely part of our suggestions. We hope that this could be a reference to the manufactures of similar devices as well
Starting Page	71
Ending Page	75
File Size	187634
Page Count	5
File Format	PDF
ISBN	1424401836
DOI	10.1109/CEEM.2006.257909
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-08-01
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electrostatic discharge Electronic equipment testing Immunity testing Dictionaries Frequency Performance analysis Packaging Protection Light emitting diodes Materials testing package material ESD PCB electronic dictionary
Content Type	Text
Resource Type	Article

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