NDLI: Device-level transient fault modeling

Content Provider	IEEE Xplore Digital Library
Author	Ries, G.L. Choi, G.S. Iyer, R.K.
Copyright Year	1994
Description	Author affiliation: Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA (Ries, G.L.; Choi, G.S.; Iyer, R.K.)
Abstract	This paper examines the accuracy of a discrete logic-level fault model often assumed in gate-level or discrete timing simulation. The analysis is done by comparing the faulty behavior predicted by the discrete model to that predicted by a circuit-level SPICE model whose accuracy is generally accepted. The comparison is made at both the subcircuit level, by measuring latch errors, and the system level, by measuring pin errors and data register errors, using the Motorola MC68000 as the target system. The results of the analysis show that the behavior predicted by the discrete model varies significantly from that of the circuit-level model when the injection site has multiple propagation paths to the circuit outputs (or latches) or is an internal node of one of the logic gates, even if the pulse width of the discrete transient is carefully chosen. However, the two models can be made to match for injection sites that are gate inputs or outputs and have only a single propagation path to circuit outputs. The differences in the latch errors predicted by the two models at the subcircuit level lead to over a 40% difference in the number of predicted pin errors and a 50% difference in the number of data errors predicted at the system level.<>
Starting Page	86
Ending Page	94
File Size	770252
Page Count	9
File Format	PDF
ISBN	0818655208
DOI	10.1109/FTCS.1994.315654
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-06-15
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Predictive models Circuit faults Latches Timing Circuit simulation SPICE Registers Logic gates Logic circuits Pulse circuits
Content Type	Text
Resource Type	Article

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