NDLI: Co-evolution of test programs and stimuli vectors for testing of embedded peripheral cores

Content Provider	IEEE Xplore Digital Library
Author	Bolzani, L. Sanchez, E. Schillaci, M. Squillero, G.
Copyright Year	2007
Description	Author affiliation: Politecnico di Torino, Turin (Bolzani, L.; Sanchez, E.; Schillaci, M.; Squillero, G.)
Abstract	Research community has not investigated as deeply as necessary the test generation problem of peripheral modules inside a system-on-a-chip (SoC), yet. Testing process for a peripheral core requires two distinct but highly correlated tasks: peripheral configuration and peripheral exercising. The configuration task is usually performed by an assembly program executed by the microprocessor within the SoC; whereas peripheral exercising directly concerns to the use of the device, which may be activated by both the executed program and a carefully devised set of external stimuli. When embedded in a SoC, peripheral cores introduce new issues for their testing. In this paper an automatic approach able to co- evolve assembly programs and stimuli sets for peripheral cores embedded in a SoC is described. The presented approach is based on an evolutionary algorithm that exploits high-level simulation and gathers coverage metrics information to produce the test sets. The proposed method considerably reduces the required efforts to produce a suitable test set with respect to the previous approaches, broadening its applicability and increasing its usefulness.
Starting Page	3474
Ending Page	3481
File Size	357849
Page Count	8
File Format	PDF
ISBN	9781424413393
DOI	10.1109/CEC.2007.4424922
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-09-25
Publisher Place	Singapore
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Evolutionary computation Linear discriminant analysis
Content Type	Text
Resource Type	Article

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