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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Zhiling Zhao Shangchun Fan Dezhi Zheng |
| Copyright Year | 2012 |
| Description | Author affiliation: Science and Technology on Inertial Laboratory, Fundamental Science on Novel Inertial Instrument & Navigation System Technology Laboratory, School of Instrumentation Science and Opto-electronics Engineering, Beihang University, BUAA, Beijing, China (Zhiling Zhao; Shangchun Fan; Dezhi Zheng) |
| Abstract | A variable permittivity capacitance measuring method is proposed in this paper for solid wood plate defects detection. A fast and non-contact NDT is realized by measuring the difference of capacitances between the plates with and without defects. Theoretical and simulation analysis are firstly presented to validate this method, then two wood samples with knots and holes are tested. There are 0.1059pF(2.73%), 0.0841pF(2.18%) and 0.0576pF(1.50%) positive mutations of capacitance for the first sample at its three knots; while there are 0.0074pF(0.20%), 0.0171pF(0.47%), 0.0262pF(0.72%) and 0.0383pF(1.1%) negative mutations of capacitance for the second sample with one, two, three and four holes respectively, which demonstrates that the mutation of capacitance value increases with the defects' size. This new method is more suitable for the online processing and production, which is able to identify and locate the wood defects effectively and accurately. |
| Starting Page | 153 |
| Ending Page | 156 |
| File Size | 732300 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781467326155 |
| e-ISBN | 9781467326179 |
| DOI | 10.1109/ISICT.2012.6291597 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-07-11 |
| Publisher Place | United Kingdom |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electrodes Capacitors Solid wood plate Capacitance Solids Capacitive sensors Permittivity Electrostatics Capacitive detection NDT |
| Content Type | Text |
| Resource Type | Article |
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