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Content Provider | IEEE Xplore Digital Library |
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Author | Kulkarni, N. Gopinath, K. |
Copyright Year | 2013 |
Description | Author affiliation: Comput. Sci. & Autom, Indian Inst. of Sci., Bangalore, India (Kulkarni, N.; Gopinath, K.) |
Abstract | Maintaining metadata consistency is a critical issue in designing a filesystem. Although satisfactory solutions are available for filesystems residing on magnetic disks, these solutions may not give adequate performance for filesystems residing on flash devices. Prabhakaran et al. have designed a metadata consistency mechanism specifically for flash chips, called Transactional Flash[1]. It uses cyclic commit mechanism to provide transactional abstractions. Although significant improvement over usual journaling techniques, this mechanism has certain drawbacks such as complex protocol and necessity to read whole flash during recovery, which slows down recovery process. In this paper we propose addition of thin journaling layer on top of Transactional Flash to simplify the protocol and speed up the recovery process. The simplified protocol named Quick Recovery Cyclic Commit (QRCC) uses journal stored on NOR flash for recovery. Our evaluations on actual raw flash card show that journal writes add negligible penalty compared to original Transactional Flash's write performance, while quick recovery is facilitated by journal in case of failures. |
Sponsorship | IEEE Bangalore Sect. |
Starting Page | 1 |
Ending Page | 6 |
File Size | 488668 |
Page Count | 6 |
File Format | |
ISBN | 9781467346092 |
e-ISBN | 9781467346085 |
DOI | 10.1109/CONECCT.2013.6469317 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2013-01-17 |
Publisher Place | India |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Strips Protocols Nonvolatile memory Random access memory Ash Benchmark testing Kernel |
Content Type | Text |
Resource Type | Article |
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