NDLI: Comparison of radiation temperature measurement precision between middlewave and longwave thermal-imaging systems

Content Provider	IEEE Xplore Digital Library
Author	Zhiyuan Sun Wei Zhu
Copyright Year	2012
Description	Author affiliation: Changchun Institute of Optics, Fine Mechanics and Physics, CIOMP, The Chinese Academy of Science, Changchun, China (Zhiyuan Sun; Wei Zhu)
Abstract	A comparison study on temperature measurement precision between middlewave 3–5μm and longwave 8–12μm measuring thermal imaging systems has been conducted. The study was limited to systems working in indoor conditions and the target's temperature is in the range of 270K∼900K. First, the Disturb Resisting Function (DRF) of infrared systems is deduced. On the base of DRF curve, we find that the middlewave infrared system get the smaller influences under the same size disturb compared with the longwave system. A theory of the influence of target's physical characteristic and measurement conditions on the accuracy of temperature measurements has been developed. On the basis of the developed formulas an analysis of the influence of signal disturbances (because of incorrectly assumed emissivity, limited transmittance of the atmosphere, radiation reflected by the object and shift of optics radiation) on the accuracy of temperature measurement has been made. It has been found that the middlewave systems in typical temperature range offer generally better accuracy in temperature measurement than the longwave ones do.
Starting Page	591
Ending Page	596
File Size	711558
Page Count	6
File Format	PDF
ISBN	9781467326384
e-ISBN	9781467326391
DOI	10.1109/ICoOM.2012.6316344
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-08-23
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature measurement Radiation temperature measurement Temperature distribution Accuracy Atmospheric measurements Measurement uncertainty Atmosphere Infrared detector Thermal imaging systems Optics
Content Type	Text
Resource Type	Article

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