NDLI: Comparing high accuracy frequency standards via TAI

Content Provider	IEEE Xplore Digital Library
Author	Wolf, P. Petit, G. Peik, E. Tamm, C. Schnatz, H. Lipphardt, B. Weyers, S. Wynands, R. Richard, J.-Y. Bize, S. Chapelet, F. Pereira dos Santos, F. Clairon, A.
Copyright Year	2006
Description	Author affiliation: PTB, Braunschweig, Germany (Peik, E.; Tamm, C.; Schnatz, H.; Lipphardt, B.; Weyers, S.; Wynands, R.) \|\| LNE-SYRTE, Obs. de Paris, Paris, France (Richard, J.-Y.; Bize, S.; Chapelet, F.; Pereira dos Santos, F.; Clairon, A.) \|\| BIPM, Sèvres, France (Wolf, P.; Petit, G.)
Abstract	Over the last few years the number of high accuracy (uncertainties in the low $10^{-15}$ or less) primary frequency standards contributing to TAI has increased significantly from only two over the period 2000 - 2002 to seven over the period 2002 - 2005. As a consequence the number of individual measurements of TAI frequency by such standards over the period 1999 to 2005 is >; 60 and increasing rapidly. Additionally, several other atomic transition frequencies (Rb, $Yb^{+},$ $Hg^{+},$ $Sr^{+},...)$ have been repeatedly measured over the same period with comparable accuracies. The resulting overall set of data is now sufficiently large to be able to obtain meaningful statistics for the complete data set and, in some cases, for the contributions from individual standards. We show the ensemble of the data available to the BIPM at the time of the conference together with the results of some basic statistical analysis. In particular, we investigate the impact of these standards on the overall uncertainty of the realisation of the SI second via TAI, and the performance of some individual standards. Our results indicate that while there is good self coherence of most studied standards (especially for recent data) there seems to be significant disagreement between individual standards. We briefly discuss some potential sources of that disagreement (time transfer noise, uncertainties of the standards, instability of the reference timescale, etc...). We hope that, in the long term, this ongoing study will allow a better characterisation of the ensemble of standards and their impact on TAI.
Starting Page	476
Ending Page	485
File Size	201852
Page Count	10
File Format	PDF
ISBN	9781467326421
e-ISBN	9783980574181
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-03-27
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	PTB
Subject Keyword	Strontium Atomic measurements Uncertainty Measurement uncertainty Frequency measurement Standards Atomic clocks
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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