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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Junlin Hu Jiwen Lu Yap-Peng Tan |
| Copyright Year | 2015 |
| Description | Author affiliation: Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore (Junlin Hu; Yap-Peng Tan) || Adv. Digital Sci. Center, Singapore, Singapore (Jiwen Lu) |
| Abstract | This paper investigates the problem of fine-grained face verification under unconstrained conditions. For the conventional face verification task, the verification model is trained with some positive and negative face pairs, where each positive sample pair contains two face images of the same person while each negative sample pair usually consists of two face images from different subjects. However, in many real applications, facial appearance of the twins looks very similar even if they are considered as a negative pair in face verification. Therefore, it is important to differentiate a given face pair to determine whether it is from the same person or a twins for a practical face verification system because most existing face verification systems fails to work well in such a scenario. In this work, we define the problem as fine-grained face verification and collect an unconstrained face dataset which contains 455 pairs of identical twins to generate negative face pairs to evaluate several baseline verification models for fine-grained unconstrained face verification. Benchmark results on the unsupervised setting and restricted setting show the challenge of the fine-grained face verification in the wild. |
| Starting Page | 79 |
| Ending Page | 84 |
| File Size | 886029 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781479978243 |
| DOI | 10.1109/ICB.2015.7139079 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-05-19 |
| Publisher Place | Thailand |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Measurement Training Accuracy Protocols Benchmark testing Feature extraction Face |
| Content Type | Text |
| Resource Type | Article |
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