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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Su Yongzhi Xue Yongduan Xu Bingyin Liu Dong |
| Copyright Year | 2011 |
| Description | Author affiliation: Shanghai Jiaotong University, 200240, China (Su Yongzhi; Liu Dong) || China University of Petroleum (East China), Qingdao 266555, China (Xue Yongduan) || Kehui Electric Co., Ltd., Zibo 255087, China (Xu Bingyin) |
| Abstract | The generation principle of electronic arc-suppression coil transient (EACT) and its distribution in fault and sound lines are analyzed in this paper. Then the effect on reliability of fault line selection is analyzed on the basic of the analysis of EACT. It is seen that if the fault resistance is low, the EACT is benefit for fault line selection. And if the fault resistance is large, it will be bad for selection. For polarity comparison methods, it will affect the reliability of fault line selection. Finally, the effects of EACT on fault line selection based on transient signals are verified by simulations |
| Starting Page | 2410 |
| Ending Page | 2416 |
| File Size | 1227048 |
| Page Count | 7 |
| File Format | |
| ISBN | 9781424496228 |
| e-ISBN | 9781424496211 |
| DOI | 10.1109/APAP.2011.6180842 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-10-16 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Integrated circuits Non-solidly earthed network The reliability of fault line selection Electronic arc-suppression coil Transient analysis Fault line selection |
| Content Type | Text |
| Resource Type | Article |
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