NDLI: Using image processing in grading tile with Gabor wavelet

Content Provider	IEEE Xplore Digital Library
Author	Sadeghi, M. Memarzadeh, M. Shafiee, M. Zavareh, F.M.
Copyright Year	2012
Description	Author affiliation: Imam Hossein Univ., Tehran, Iran (Memarzadeh, M.) \|\| Dept. of Comput., Islamic Azad Univ., Zavareh, Iran (Sadeghi, M.; Zavareh, F.M.) \|\| Amirkabir Univ. of Technol., Tehran, Iran (Shafiee, M.)
Abstract	For gradation of tiles in control lines of factories, it is needed to ways for detection of each deferent defect that may exist on tiles during production. According to expert's statement, one of the most defect caused reduction of quality of tiles are cracks and spots. These kinds of defects is named sharp defect that generate low width and high contrast's structure in image. One of image processing tools that by it can show low width and high contrast's structure in image is morphological operation such as dilation and erosion. In this paper, Gabor wavelet is used to defects detection. This method is simulated in MATLAB environment and is examined on image of kind of tiles such as simple, color and designed that lead to good result to gradation and sharp defect detection of tiles. Gradable of different tiles is preference of this method rather than previous method.
Sponsorship	IEEE Harbin. Sect.
Starting Page	2249
Ending Page	2252
File Size	308031
Page Count	4
File Format	PDF
ISBN	9781467329637
e-ISBN	9781467329644
DOI	10.1109/ICCSNT.2012.6526366
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-12-29
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Sharp defects Image processing Tue Gabor wavelet
Content Type	Text
Resource Type	Article

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