NDLI: Low cost high performance microcontroller based semiconductor device tester

Content Provider	IEEE Xplore Digital Library
Author	Suresh, K.J. Amrut, K.V.
Copyright Year	2013
Description	Author affiliation: Electron. & Telecommun. Dept., Jawaharlal Nehru Eng. Coll., Aurangabad, India (Suresh, K.J.; Amrut, K.V.)
Abstract	This paper deals with design and implementation of a versatile tester system for diode, bipolar junction transistor (BJT), and junction field effect transistor (JFET). The basic building blocks for this tester design include PIC 18F452 microcontroller, analog multiplexer/demultiplexer 74HC4052, and Liquid Crystal Display (LCD). The tester system discussed in this paper provide accurate identification of semiconductor device under test (Diode, BJT, JFET), types of bipolar transistor (NPN, PNP), types of junction field effect transistor (N channel JFET, P channel JFET). The proposed system also detects leads of diode, bipolar junction transistor (BJT), and junction field effect transistor (JFET). Apart from this the tester also measures various parameters of above mentioned semiconductor devices such as forward voltage $(V_{F})$ and forward current $(I_{F})$ for diode, current gain $(H_{FE})$ for BJT, saturation current with the gate shorted to the source $(I_{DSS})$ for JFET. All measurement and test results are clearly represented on LCD. Low power consumption, simple hardware, user friendly design and compact size are salient features of this semiconductor device tester.
Sponsorship	IEEE Gujarat Sect.
Starting Page	1
Ending Page	5
File Size	417621
Page Count	5
File Format	PDF
e-ISBN	9781479907274
DOI	10.1109/NUiCONE.2013.6780131
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-11-28
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Resistors PIC microcontroller Voltage measurement Microcontrollers Diode Junction field effect transistor (JFET) Bipolar junction transistor (BJT) Semiconductor diodes JFETs Current gain
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in