NDLI: Characterization of Millimeter-Wave Active and Passive Components Embedded in Test Fixtures

Content Provider	IEEE Xplore Digital Library
Author	Mehdi, G. Hu Anyong Zheng Cheng Miao, J. Mueed, A.
Copyright Year	2013
Description	Author affiliation: Center for Wireless Commun., CESAT, Islamabad, Pakistan (Mueed, A.) \|\| Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing, China (Mehdi, G.; Hu Anyong; Zheng Cheng; Miao, J.)
Abstract	The performance of millimeter-wave active and passive components is sensitive to the discontinuities associated with the test fixtures. In order to accurately characterize the device-under-test (DUT) and obtain the DUT only performance, the fixture effects must be removed from the overall measurement. Such process is generally referred to as de-embedding. In this work, different de-embedding methods are reviewed and two of these namely the thru-reflect-line (TRL) and the thru-line (TL) are employed to de-embed an edge-coupled band-pass filter (BPF) and a low noise amplifier (LNA) both operating at Ka band. The two DUTs along with the TRL kit are realized on a substrate with dielectric constant of 6.2. Measured results obtained from the two methods are compared.
Starting Page	136
Ending Page	139
File Size	268578
Page Count	4
File Format	PDF
e-ISBN	9781479925032
DOI	10.1109/FIT.2013.32
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-12-16
Publisher Place	Pakistan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Band-pass filters DUT Thru-line De-embedding Fixtures Transmission line measurements Thru-reflect-line Frequency measurement Calibration Scattering parameters Standards Millimter-wave
Content Type	Text
Resource Type	Article

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