NDLI: A comparison of range test method-linear sampling method for microwave imaging

Content Provider	IEEE Xplore Digital Library
Author	Ozgur, S. Abbak, M. Akduman, I.
Copyright Year	2015
Description	Author affiliation: Dept. of Electron. & Commun. Eng., Istanbul Tech. Univ., Istanbul, Turkey (Ozgur, S.; Abbak, M.; Akduman, I.)
Abstract	Range test method (RTM) is a qualitative imaging algorithm, which is based on analytic extensibility of the scattered electric field. Although detailed analysis of the RTM can be found in the mathematical literature, the method is not well-analyzed from an engineering perspective. In particular, the numerical performance of RTM is not compared with the other well-known shape reconstruction methods. In this direction, this paper present a numerical comparison of the RTM with the linear sampling method (LSM). To this aim, scattered electric fields for several configurations are produced synthetically via a 2D method of moments (MoM) code. After corrupting the scattered field data with a synthetic noise, the noisy fields are supplied to both LSM and RTM and binary shape reconstructions are obtained. Quality of the reconstruction results are evaluated with the well-known Jaccard index. Obtained reconstructions show that the RTM is also a promising qualitative approach for microwave imaging applications.
Starting Page	575
Ending Page	578
File Size	656232
Page Count	4
File Format	PDF
e-ISBN	9781509000555
DOI	10.1109/TELFOR.2015.7377533
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-11-24
Publisher Place	Serbia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Shape Linear sampling method (LSM) Microwave theory and techniques Sampling methods Range test method (RTM) Indexes Image reconstruction Microwave imaging
Content Type	Text
Resource Type	Article

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