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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kyoung-Jun Lee Yun-Seong Kim Jung-Hyeon Ryu Seung-Jae Park Hyeong-Kee Rhyou |
| Copyright Year | 2015 |
| Description | Author affiliation: High Power Testing Dept. I, Korea Electrotechnol. Res. Inst., Changwon, South Korea (Kyoung-Jun Lee; Yun-Seong Kim; Jung-Hyeon Ryu; Seung-Jae Park; Hyeong-Kee Rhyou) |
| Abstract | Development in electrical power transmission system requires the use of circuit breakers with increasing breaking capacity. To meet the test requirements of larger capacity of high voltage capacity, the parallel current injection synthetic testing is the most widely used method instead of direct testing, based on IEC 62271-100 and IEC 62271-101. During synthetic testing, the making switch is used to supply short circuit current and the gap-switch is triggered at the desired moment before the current zero. To control the trigger timing of gap-switch, a current zero anticipator (CZA) is essential in high power testing laboratory. This paper presents an algorithm and hardware implementation of current zero anticipator that is robust to surge current or noise in parallel current injection synthetic testing. |
| Starting Page | 601 |
| Ending Page | 603 |
| File Size | 667906 |
| Page Count | 3 |
| File Format | |
| e-ISBN | 9781467374149 |
| DOI | 10.1109/ICEPE-ST.2015.7368430 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-10-25 |
| Publisher Place | South Korea |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | IEC 62271-100 Circuit breakers Short-circuit currents A.C. high-voltage circuit breakers IEC 62271-101 Robustness Timing IEC Standards Testing Switching circuits Current zero anticipator Parallel current injection synthetic testing |
| Content Type | Text |
| Resource Type | Article |
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