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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Shuo Huang Jun Yang |
| Copyright Year | 2015 |
| Description | Author affiliation: Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China (Shuo Huang; Jun Yang) |
| Abstract | Gamma charts based on time-between-events (TBE) data are very useful for process monitoring in the manufacturing industry. The average run length (ARL) is widely adopted as a criterion to evaluate the performance of Gamma charts. The traditional equal-tail probability limits are often used to provide the control limits of Gamma charts, however their ARL curves will not approach their maximum values at their in-control occurrence rates. To overcome the above problem, an ARL-unbiased design for Gamma charts with known parameters is proposed. The comparison result shows that the ARL-unbiased Gamma control charts are more sensitive to systematic deterioration than the traditional charts with the equal-tail probability limits. Finally, a real example is illustrated to demonstrate the implementation of the proposed approach. |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 608062 |
| Page Count | 6 |
| File Format | |
| e-ISBN | 9781467385572 |
| DOI | 10.1109/ICRSE.2015.7366498 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-10-21 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Gamma distribution Systematics Average run length (ARL) Control charts Reliability engineering Systems engineering and theory Mathematical model Chi-square distribution Monitoring Time between events ARL-unbiased design |
| Content Type | Text |
| Resource Type | Article |
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