NDLI: A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect

Content Provider	IEEE Xplore Digital Library
Author	Vales-Alonso, J. Munoz-Gea, J.P. Alcaraz, J.J.
Copyright Year	2015
Description	Author affiliation: Dept. of Inf. & Commun. Technol., UPCT, Spain (Vales-Alonso, J.; Munoz-Gea, J.P.; Alcaraz, J.J.)
Abstract	In this paper we introduce the problem of the continuous wave outage effect in the RFID FSA reading process. Namely, when a tag transitory loses CW signal, upon recovery, it does not continue taking part in the reading round. This effect impacts in the RFID reading efficiency, and may lead to different criteria to compute the optimal frame-length configurations. In this extended abstract we develop an analytical model that allows computation of the distribution of the number of identifications under outage effect. Based on this distribution, we obtain the mean number of identifications for a few setups. The main conclusion is that outage effect may lead to noticeable differences in the number of identifications (up to 22% in our experiments). In the full version of this paper we expect to provide results for additional setups, and to study optimal frame-length selection policies under continuous wave outage effect.
Starting Page	48
Ending Page	52
File Size	123409
Page Count	5
File Format	PDF
e-ISBN	9783200037359
DOI	10.1109/EURFID.2015.7332384
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-10-22
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	EURASIP
Subject Keyword	Analytical models Computational modeling FSA Rician channels Analysis RFID Probability distribution Random variables Mathematical model Performance Radiofrequency identification
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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