NDLI: Orphan Defects: Chance Finding?

Content Provider	IEEE Xplore Digital Library
Author	Prasad, D.S.U.M. Kanakadandi, S.S.P.
Copyright Year	2014
Description	Author affiliation: HCL Technol., Noida, India (Prasad, D.S.U.M.; Kanakadandi, S.S.P.)
Abstract	At least 5% and at most 25% defects escape the rigorous to routine testing practices of various software products. Defects imply various holes in the test suite creation as well as selection. We implemented hybrid distance based algorithms to derive defect to test case mapping that yielded two metrics - Test Coverage Metric and Test Sufficiency Metric. In addition to these two metrics, we stumbled upon a set of defects that are not mapped to any test cases which were named as 'orphan defects (OD)'. Finding orphan defects contrasts the testing team's belief that they have created a comprehensive test suite with total coverage, we have coined the term 'chance finding' to empaahsize that it is serendipitous finding while analyzing various defects, both internal and custoemr reported. These defects have been further analyzed for any associated features and presented to the user for validation and adding required test cases. Upon using this procedure, one of the industry partners has brought down the orphan defects by about 90% over three patch releases and test coverage and sufficiency have been improved considerably.
Starting Page	74
Ending Page	79
File Size	88169
Page Count	6
File Format	PDF
e-ISBN	9781479979103
DOI	10.1109/ICAIET.2014.22
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-12-03
Publisher Place	Malaysia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Measurement Training Test Coverage; Test Case Sufficiency; Matrix Regression; Orphan defect; Field Defect; Internal Defect Computer bugs Feature extraction Software Natural language processing Testing
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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