NDLI: Reliability analysis for multi-component degraded system subject to multiple dependent competing failure process

Content Provider	IEEE Xplore Digital Library
Author	Jiaxiang Liu Xiaogang Li Chao Peng
Copyright Year	2015
Description	Author affiliation: Sch. of reliability & Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China (Jiaxiang Liu; Xiaogang Li; Chao Peng)
Abstract	Concerning on estimating reliability and performance distribution of multi-component degraded system which subject to multiple dependent competing failure process, we proposed an algorithm integrating and utilizing the basic degradation information of constituted components and failure propagation theory. On the basis of known basic degradation information of components, we introduced the proportional hazards model (PHM) to describe the effect of environmental stress and degradation interactions from other components, which impact others through changing some intermediate media such as raising the temperature, increasing the current and so on. The reliability of system was evaluated with multi-state system theory, and the system structure function was obtained by response surface methodology (RSM). Then we utilized the Monte Carlo method to sample the pseudo lifetime of system, and distribution test was adopted to obtain the reliability function. A numerical example was also given to illustrate the proposed model.
Starting Page	1
Ending Page	5
File Size	451463
Page Count	5
File Format	PDF
e-ISBN	9781467385541
DOI	10.1109/PHM.2015.7380060
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-10-21
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Degradation Performance reliability Multiple dependent competing failure process Petri nets Multi-state system Response surface methodology Reliability Stress Monitoring Proportional hazard model
Content Type	Text
Resource Type	Article

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